ESREF 2008, the 19th European Symposium on Reliability of Electron Devices will take place at Maastricht (The Netherlands) from 29th September to 2nd October 2008.
This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.
The scope of EOBT, Electron and Optical Beam Test Conference is included in the ESREF Conference.
This event is organised by NXP Semiconductors, IMEC and MESA+ Institute for Nanoelectronics of the University of Twente
LOCATION OF THE CONFERENCE:
MECC Maastricht, The Netherlands
with the technical co-sponsorship of IEEE
- Electron Devices Society, IEEE - Reliability Society
6229 GV Maastricht
tel: +31(0)43 383 8383
info@mecc.nl
Participants can order additional copys of the proceedings via the registration tool, or buy them on site. It is also possible to buy a copy of the ESREF proceedings for non participants (45 Euro's per copy). For more information about Esref or to order the proceedings, please contact :
Annemiek Janssen
PO Box 217
NL 7500 AE Enschede
The Netherlands
Phone: x-31-(0)53-4893879
Fax : x-31-(0)53-4891034
e-mail: esref2008@ewi.utwente.nl