Quality and Reliability Techniques for
Devices and Systems
Reliability simulation, Virtual qualification
Reliability indicators, Early detection, Screening methods
Reliability test structures, Limits to accelerated tests
Yield/reliability relationship, Field reliability
Realisation of stringent reliability requirements, Zero defects
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Packaging and Assembly Reliability
Board level reliability,
Failure mechanisms and environmental constraints,
MCM, CSP, BGA, SiP, WLP, QFN, advanced PCB,
Bonding, solders and joints,
Connectors.
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Physical Modeling and Simulation for Reliability Prediction
 Characterization of defects,
Defect models,
Numerical simulation,
Simulation of reliability-related circuit constraints.
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Failure Mechanisms in New Materials and Transistors
Process-related issues,
Hot carriers, NBTI, PBTI
Passivation stability,
Dielectric integrity, High-K gate oxides,
Metal migration: mechanical and thermal aspects,
Latchup, ESD,
Low-K dielectrics and Cu interconnects.
Reliability related to nanotechnology.
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Power Devices Reliability
Smart-power devices, IGBT, thyristors,
Thermal management.
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Reliability of New Technologies
Non-volatile and programmable devices,
Silicon on Insulator devices,
Wide bandgap semiconductors,
Microwave and compound semiconductor devices,
Photonic devices: Optoelectronics and lasers,
MEMS and MOEMS, Sensors and actuators,
Interconnects,
Passive elements and modules.
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Advanced Failure Analysis: Defect Detection and Analysis
Electron, ion and laser beam techniques,
Static or dynamic techniques,
Backside techniques,
Scanning probe techniques,
Acoustic microscopy,
Electrical and thermal characterization,
,Sample preparation, construction analysis
Failure analysis: case studies.
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