Failure analysis  

European Focussed Ion Beam Users Group(EFUG) . The EFUG holds a users meeting on monday the 29th September 2008 at the ESREF venue.

Other reliability Conferences and workshops  

International Reliability Physics Symposium (IRPS)

International Integrated Reliability Workshop (IIRW)

International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

Advanced materials/Failure Analysis Workshop (AMA)

5th International Conference on Integrated Power Electronics Systems (CIPS 2008)

Reliability Of Compound Semiconductors Workshop (ROCS)

LOng Term Use of electronicS (LOTUS) WORKSHOP

Reliability related websites  

IEEE Reliability Society

IEEE Transactions on Devices and Materials Reliability (TDMR)